The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Jan. 03, 2012
Applicants:

Michael DE Rosa, Pittsburgh, PA (US);

Marc Unangst, Pittsburgh, PA (US);

Inventors:

Michael De Rosa, Pittsburgh, PA (US);

Marc Unangst, Pittsburgh, PA (US);

Assignee:

GOOGLE INC., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/024 (2013.01);
Abstract

Methods and apparatuses for dynamically adjusting sampling rates for statistical data collection are taught. Records associated with a first task communicating with a second task that are sampled at a first sampling rate are received. At least the first task is associated with a first processing job. A target sampling rate for the first processing job is determined using the records where the target sampling rate is based on a minimum sampling quota and a maximum sampling quota. The target sampling rate is compared to the first sampling rate, and a determination of whether to adjust the first sampling rate to the target sampling rate is based on a result of the comparison. In this manner, tracing of processing jobs, such as those including a plurality of tasks, can be adjusted based on the needs and size of the job and network limitations.


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