The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Feb. 20, 2013
Tekelec, Inc., Morrisville, NC (US);
Uri Baniel, Buffalo Grove, IL (US);
Tarek Abou-Assali, Boston, MA (US);
Manish Kumar Gupta, Pennington, NJ (US);
Sayan Chowdhury, Somerville, MA (US);
Tekelec, Inc., Morrisville, NC (US);
Abstract
A policy and charging rules function (PCRF), generates a Diameter audit message concerning an application level Diameter session for which local resources are maintained by the PCRF. The PCRF includes, in the audit message, a fake parameter value. The PCRF sends the audit message with the fake parameter value to the OCS or the AF over an Sy or Rx interface. The PCRF receives a response to the audit message from the OCS or AF. The PCRF determines, based on the response, whether the application level session comprises and orphan session. The PCRF, in response to determining that the application level Diameter session comprises an orphan session frees the local resources maintained by the PCRF for the orphan session.