The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Nov. 26, 2014
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Hufei Zhu, Shenzhen, CN;

Ganghua Yang, Paris, FR;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01); G06K 9/36 (2006.01); H04J 14/00 (2006.01); H04L 1/00 (2006.01); H03M 7/30 (2006.01); H04B 1/16 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0036 (2013.01); H03M 7/3062 (2013.01); H03M 7/6047 (2013.01); H04B 1/16 (2013.01);
Abstract

A method includes determining a correlation between a first residual error and multiple columns in a sensing matrix according to a measured value of an original signal and the sensing matrix, and determining a first array most correlative to the measured value of the original signal in the sensing matrix according to the correlation between the first residual error and the multiple columns; determining a correlation between a kresidual error and the multiple columns according to a correlation between a (k−1)residual error and the multiple columns, and determining a karray most correlative to the measured value of the original signal according to the correlation between the kresidual error and the multiple columns in the sensing matrix, where 2≦k≦K; and recovering the original signal after determining a Karray most correlative to the measured value of the original signal.


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