The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jun. 06, 2013
Electronics and Telecommunications Research Institute, Daejeon, KR;
Su Na Choi, Daejeon, KR;
Seung Keun Park, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
An apparatus and method for evaluating statistical interference concerning a multi-source noise environment of an electromagnetic (EM) zone are disclosed. The apparatus for evaluating statistical interference may include a receiver to receive an EM wave in a preset frequency band, a spectrum analyzer to analyze the received EM wave and to measure interference in the preset frequency band, a frequency selector to select an interest frequency in the frequency band based on a level of the measured interference, an amplitude probability distribution (APD) measurement unit to measure an APD of an interference signal with respect to the interest frequency, and a comparator to compare the measured APD to a preset limit and to draw a probability of the limit or higher of interference occurring.