The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Mar. 08, 2012
Matthew A. Mow, Los Altos, CA (US);
Thomas E. Biedka, San Jose, CA (US);
Liang Han, Mountain View, CA (US);
Rocco V. Dragone, Jr., Mountain View, CA (US);
Hongfei HU, Santa Clara, CA (US);
Dean F. Darnell, San Jose, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Mattia Pascolini, Campbell, CA (US);
Ruben Caballero, San Jose, CA (US);
Matthew A. Mow, Los Altos, CA (US);
Thomas E. Biedka, San Jose, CA (US);
Liang Han, Mountain View, CA (US);
Rocco V. Dragone, Jr., Mountain View, CA (US);
Hongfei Hu, Santa Clara, CA (US);
Dean F. Darnell, San Jose, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Mattia Pascolini, Campbell, CA (US);
Ruben Caballero, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.