The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Aug. 26, 2014
Applicants:

Sang-in Park, Anyang-si, KR;

Boh-chang Kim, Yongin-si, KR;

Bu-il Nam, Hwaseong-si, KR;

Dong-ku Kang, Seongnam-si, KR;

Inventors:

Sang-In Park, Anyang-si, KR;

Boh-Chang Kim, Yongin-si, KR;

Bu-il Nam, Hwaseong-si, KR;

Dong-Ku Kang, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 8/08 (2006.01); G11C 16/08 (2006.01); G11C 16/34 (2006.01); G11C 29/10 (2006.01); G11C 29/44 (2006.01); G11C 16/00 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 8/08 (2013.01); G11C 16/08 (2013.01); G11C 16/349 (2013.01); G11C 29/10 (2013.01); G11C 29/44 (2013.01); G11C 16/00 (2013.01); G11C 2029/1202 (2013.01);
Abstract

A method of testing a non-volatile memory device and a method of managing the non-volatile memory device are provided. The method of testing the non-volatile memory device includes calculating first and second values based on program loop frequencies corresponding to word lines of a memory area. A characteristic value of the memory area may be calculated based on the first and second values, and may be compared to a reference value to determine whether the memory area is defective.


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