The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Sep. 25, 2013
Fujifilm Corporation, Tokyo, JP;
Hideki Yamagishi, Kanagawa, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
An image evaluation device includes a storage unit that stores sample image data that represent a virtual sample image simulating a sample image included in a sample printout that is recognized as a non-defective printout; a reading unit that reads an inspection object image included in an inspection object printout obtained by printing the sample image on a recording medium by a printing device using image data representing the sample image; an extraction unit that extracts a line defect including a linear pattern formed in a specific direction from the inspection object image represented by inspection object image data, based on a difference value between the sample image data and the inspection object image data; and an evaluation unit that evaluates a visibility of the line defect extracted by the extraction unit.