The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Aug. 13, 2014
Realtek Semiconductor Corp., HsinChu, TW;
Pei-Ying Hsueh, Changhua County, TW;
Chun-Yi Kuo, Taipei, TW;
Chien-Mo Li, Taipei, TW;
Po-Juei Chen, Taipei, TW;
Realtek Semiconductor Corp., Science Park, HsinChu, TW;
Abstract
A systematic defect analyzing method, includes: partitioning physical sites into groups to obtain a plurality of groups of physical sites according to a plurality of physical features of a chip corresponding to different potential systematic defects; utilizing a processor to compute at least one defect probability of each group of physical sites; and deriving an analysis result according to the plurality of defect probabilities corresponding to the plurality of groups of physical sites.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile