The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Mar. 12, 2013
Applicants:

Ivan Schreter, Malsch, DE;

Dirk Thomsen, Heidelberg, DE;

Colin Florendo, Malborough, MA (US);

Blaine French, Concord, MA (US);

Inventors:

Ivan Schreter, Malsch, DE;

Dirk Thomsen, Heidelberg, DE;

Colin Florendo, Malborough, MA (US);

Blaine French, Concord, MA (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30162 (2013.01); G06F 17/30321 (2013.01); G06F 17/30584 (2013.01);
Abstract

Data records of a data set can be stored in multiple main part fragments, each of which includes a subset of the set of data records. A relative age can be assigned to each main part fragment, and a fragment-specific index segment can be created for a newest of the main part fragments. The fragment-specific index segment can provide a lookup ability for logical identifiers of data records in just the newest of the main part fragments. A multi-fragment index segment can span two or more older main fragments. The multi-fragment index segment can provide a lookup ability for logical identifiers of data records in the two or more older main part fragments.


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