The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Dec. 03, 2013
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Daniel Tuers, Kapaa, HI (US);

Thomas Ta, San Jose, CA (US);

Abhijeet Manohar, Bangalore, IN;

Assignee:

SanDisk Technologies Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01);
Abstract

Approaches are presented for adaptively re-compacting data when errors are found during a post-write verify in a non-volatile memory system, such as flash NAND memory. In one example, user data along with corresponding parity data is written into a block of non-volatile memory. After writing in the user data, but prior to writing the corresponding parity data, the user data is checked. For any word lines that fail this post-write verify, the parity data for the block is adjusted to remove the contribution of any failed word lines before this modified parity data is written into the block. The data corresponding to the failed word lines can then be written elsewhere in the memory system.


Find Patent Forward Citations

Tuers, Daniel. (2015). Adaptive data re-compaction after post-write read verification operations (U.S. Patent No. 9213601). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9213601

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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