The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Aug. 16, 2012
Jian-huei Feng, San Jose, CA (US);
Ming Jiang, San Jose, CA (US);
Clayton R. Newman, Pleasanton, CA (US);
Yeak-chong Wong, San Jose, CA (US);
Jian-Huei Feng, San Jose, CA (US);
Ming Jiang, San Jose, CA (US);
Clayton R. Newman, Pleasanton, CA (US);
Yeak-Chong Wong, San Jose, CA (US);
Western Digital (Fremont), LLC, Fremont, CA (US);
Abstract
Methods for providing run to run process control using a dynamic tuner are provided. Once such method includes receiving a data point for a process output parameter, determining whether the data point is within a desired range for the process output parameter, setting, when the data point is within the desired range, a dynamic lambda value equal to a preselected base lambda value, setting, when the data point is not within the desired range, the dynamic lambda value equal to a value based on the preselected base lambda value, a degree of difference between the data point and a target for the process output parameter, and a scale factor, calculating an exponentially weighted moving average using the dynamic lambda value, and adjusting the process control parameter in accordance with the exponentially weighted moving average.