The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Mar. 12, 2013
Asociación Centro DE Investigación Cooperativa En Nanociencias, Cic Nanogune, Donostia-San Sebastián, ES;
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Martin Schnell, Berlin, DE;
Rainer Hillenbrand, Freidberg, DE;
Paul Scott Carney, Champaign, IL (US);
Asociación Centre De Investigación Cooperativa en Nanociencias, CIC Nanogune, Donostia-San Sebastián, ES;
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods and apparatus for imaging a phase or amplitude that characterizes a scattered field emanating from a physical medium. A local probe is stepped to a plurality of successive probe positions and illuminated with an illuminating beam, while a specified phase function is imposed on a reference beam relative to the illuminating beam. A field associated with the scattered field is superimposed with the reference beam and the detection of both yields a detected signal which is recorded as a function of probe position in order to obtain a hologram. The holograph is transformed, filtered, and retransformed to generate an image. Alternatively, the illuminating beam may directly illuminate successive positions of the physical medium.