The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jun. 04, 2013
Aperio Technologies, Inc., Vista, CA (US);
Allen Olson, San Diego, CA (US);
Greg Crandall, Rancho Santa Fe, CA (US);
Dirk G. Soenksen, Carlsbad, CA (US);
LEICA BIOSYSTEMS IMAGING, INC., Vista, CA (US);
Abstract
Methods and apparatus are provided for computing focus information during scanning digital microscope slide data with a line scan camera. The systems and methods include a dynamically interleaved procedure that works by moving the specimen relative to the objective lens while the height of the objective lens is adjusted relative to the stage. Imagery data is acquired at a plurality of objective lens heights the image data from the objective lens height having maximum contrast is stored and combined into a composite digital image of at least a portion of the specimen.