The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jun. 26, 2007
Juin-jet Hwang, Mercer Island, WA (US);
Clinton T. Siedenburg, Everett, WA (US);
Ramachandra Pailoor, Woodinville, WA (US);
Mitchell Kaplan, Lake Forest Park, WA (US);
Garet G. Nenninger, Seattle, WA (US);
Juin-Jet Hwang, Mercer Island, WA (US);
Clinton T. Siedenburg, Everett, WA (US);
Ramachandra Pailoor, Woodinville, WA (US);
Mitchell Kaplan, Lake Forest Park, WA (US);
Garet G. Nenninger, Seattle, WA (US);
FUJIFILM SonoSite, inc., Bothell, WA (US);
Abstract
A system performs ultrasound parameter estimation at specific advantageous sets of points in a two- or three-dimensional field of view within re-configurable, massively parallel, programmable architectures. A power efficient system is used for processing the data, thereby increasing the ability of the system for mobile ultrasound applications. Various architectural aspects provide the ability to simultaneously accept a large number of channels of data characterized by a continuous, simultaneous flow at high sample rates. The input data is routed at high rates to a distributed and large number of processing elements, memory, and connections for simultaneous parameter estimation at multiple points in the field of view, thereby enabling data streaming through the architecture.