The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jan. 12, 2012
Manabu Kusumoto, Tokyo, JP;
Masashi Kawakami, Tokyo, JP;
Manabu Kusumoto, Tokyo, JP;
Masashi Kawakami, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A condition input device inputs a measurement condition and the information of an electronic apparatus to be measured. A measurement operation program device selects a program that causes the electronic apparatus to perform an measurement operation based on the information of a measuring target object and the measurement condition. A voltage measurement device measures a voltage variation generated by the power source of the electronic apparatus. A wave form calculating device performs an arithmetic processing, such as a filtering processing or a time-frequency conversion (e.g. Fourier conversion) for the measured voltage variation to obtain the frequency characteristics of the voltage variation. An impedance calculating device calculates an impedance from the frequency characteristics of the voltage variation and the frequency characteristics of current and the condition of the measurement operation program.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile