The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Sep. 26, 2013
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Hiroshi Kurono, Kobe, JP;
Yasuhiro Takeuchi, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
Disclosed is a sample analyzer including a transporting part configured to transport a sample rack holding one or more samples, a measuring part configured to perform a measurement on the sample of the transported sample rack and a controller. The controller is programmed to perform an analysis of a predetermined item that requires at least first and second measurement results derived respectively from first and second samples obtained from the same subject and preprocessed in different ways, and if a measurement of the predetermined item is requested and a set of first and second samples obtained from the same subject and preprocessed in different ways are transported to the measuring part, the controller controls the measuring part to perform measurements on both of the first and second samples to derive the first and second measurement results and processes them to generate an analysis result of the predetermined item.