The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Nov. 18, 2011
Applicants:
Robert Vincent Falsetti, Schnectady, NY (US);
Gary Austin Lamberton, Glenville, NY (US);
Inventors:
Robert Vincent Falsetti, Schnectady, NY (US);
Gary Austin Lamberton, Glenville, NY (US);
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 17/00 (2006.01); G01N 29/26 (2006.01); G01N 29/06 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); G01N 29/069 (2013.01); G01N 29/221 (2013.01); G01N 29/265 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01);
Abstract
A method and apparatus for determining a dimension of a defect in a component is disclosed. A linear array of acoustic transducers is used to propagate a focused ultrasonic beam along a first focal line. The focused ultrasonic beam is moved across the defect in a first array direction substantially perpendicular to the first focal line. The dimension of the defect is determined from at least one reflection of the focused ultrasonic beam from the defect as the focused ultrasonic beam moves across the defect.