The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Aug. 04, 2011
Yuka Saito, Saitama, JP;
Nobuyuki Hashimoto, Saitama, JP;
Yuka Saito, Saitama, JP;
Nobuyuki Hashimoto, Saitama, JP;
CITIZEN HOLDINGS CO., LTD., Tokyo, JP;
Abstract
A refractive index measurement apparatus includes a light source, a measurement cell including a sample as an object of refractive index measurement and diffracting light incident from the light source, a detector that detects the amount of diffracted light in at least one diffraction order other than zero order of diffracted light exiting from the measurement cell, and a control unit that determines refractive index of the sample based on the measured value of the amount of diffracted light by the detector. The measurement cell includes two substrates disposed so as to be opposed to each other and a diffraction grating disposed between the two substrates, and the diffraction grating has a plurality of members whose width decreases stepwise as approaching from one of the substrates to the other of the substrates, the sample being filled in the space between the substrates not occupied by the diffraction grating.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile