The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Dec. 06, 2012
Applicant:

Zybertec Llc, Melbourne, FL (US);

Inventor:

Andrey Muraviev, Orlando, FL (US);

Assignee:

Zybertec LLC, Melbourne, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01); G01N 21/3504 (2014.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01J 3/0205 (2013.01); G01N 21/3504 (2013.01); G01N 2201/022 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/06113 (2013.01);
Abstract

In a gas phase analyte testing method a laser beam is generated using a laser beam from a laser gain medium located within an external laser cavity. A gain parameter of the laser gain medium is changed so that the laser gain medium emits across a range of wavelengths in response to the change. The beam is passed through a test sample as the gain parameter is changed, the test sample being positioned inside the external laser cavity. A change in the spatial or spectral mode distribution or dynamics of the laser emission spectrum is detected. It is then determined whether the change in the spatial or spectral mode distribution or dynamics of the laser emission spectrum is caused by the test sample.


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