The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Dec. 10, 2012
C/o C.r.f. Società Consortile Per Azioni, Orbassano (Torino), IT;
Giuseppe D'Angelo, Orbassano, IT;
Giorgio Pasquettaz, Orbassano, IT;
C.R.F. SOCIETÀ CONSORTILE PER AZIONI, Orbassano (Torino), IT;
Abstract
A method for monitoring the quality of an industrial working process, which includes identifying defects of the working process, comprises acquiring at least one signal having multiple frequency components from the industrial working process, decomposing the at least one signal having multiple frequency components in signals having single frequency components, calculating the information content for each signal having a single frequency component, analyzing the information content for each signal having a single frequency component, and if the value of the information content of the signal at the lowest single frequency component does not represent a main percentage of the information content of the whole acquired signal, the acquired signal having multiple frequency components is evaluated as indicative of a working process with defects and a defect analysis step is performed on the signal having multiple frequency components.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile