The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Aug. 22, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Vinay K. Kolar, Bangalore, IN;

Ravindranath Kokku, Bangalore, IN;

Venkatadheeraj Pichapati, Bangalore, IN;

Assignee:

GLOBALFOUNDRIES U.S. 2 LLC, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/16 (2006.01); G01C 21/20 (2006.01); G01C 21/30 (2006.01);
U.S. Cl.
CPC ...
G01C 21/165 (2013.01); G01C 21/00 (2013.01); G01C 21/20 (2013.01); G01C 21/30 (2013.01);
Abstract

Methods, systems, and articles of manufacture for event-based location sampling for map-matching are provided herein. A method includes determining a location of an object via a device associated with the object; determining one or more temporal sampling periods of one or more location information sensors at one or more sampling regions based on (i) said location of the object and (ii) one or more items of map-matching information; capturing one or more motion-related events associated with the object via the one or more location information sensors during the determined one or more temporal periods; and generating a trajectory of the object based on the one or more captured motion-related events.


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