The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9212905 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 15, 2015

Filed:

May. 12, 2011
Applicants:

Raymond T. Klann, Channahon, IL (US);

Richard B. Vilim, Sugar Grove, IL (US);

Sergio DE LA Barrera, Chicago, IL (US);

Inventors:

Raymond T. Klann, Channahon, IL (US);

Richard B. Vilim, Sugar Grove, IL (US);

Sergio de la Barrera, Chicago, IL (US);

Assignee:

UChicago Argonne, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 15/02 (2006.01);
U.S. Cl.
CPC ...
G01B 15/02 (2013.01);
Abstract

A system and method for determining the shielding thickness of a detected radiation source. The gamma ray spectrum of a radiation detector is utilized to estimate the shielding between the detector and the radiation source. The determination of the shielding may be used to adjust the information from known source-localization techniques to provide improved performance and accuracy of locating the source of radiation.


Find Patent Forward Citations

Klann, Raymond. (2015). Method and system for determining radiation shielding thickness and gamma-ray energy (U.S. Patent No. 9212905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9212905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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