The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jul. 24, 2007
Lorenzo Merlo, Turin, IT;
Lorenzo Merlo, Turin, IT;
Hexagon Metrology S.P.A., Moncalieri, IT;
Abstract
A method of compensating the measurement errors of a measuring machine () deriving from the deformations of a machine bed () of the machine () caused by a load exerted by a workpiece to be measured on the machine bed (), characterized by a first acquisition step () in which data regarding the weight of the workpiece and the conditions of constraint of the workpiece on the machine bed are acquired by a measurement and control unit () of the measuring machine () and a second calculation step () in which correction values depending upon said data are calculated by said measurement and control unit (), wherein the first step () includes selecting a standard load condition representing the load of the workpiece from among a plurality of standard load conditions; and the second step includes the step of calculating values correlated to the deformation of the machine bed () under the load of the workpiece represented by the selected standard load condition as a linear combination of corresponding values resulting from predetermined basic load conditions.