The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Dec. 02, 2013
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Bing-Jun Zhang, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A measuring device is configured for measuring a thickness of a wall, the measuring device includes a bracket, a guide assembly, a benchmark member, and a gauge. The bracket includes a base body, a first installation portion, and a second installation portion, and the first installation portion and the second installation portion extending from opposite ends of the base body. The guide assembly is movably received through the first installation portion. The benchmark member is mounted on the second installation portion. The gauge mounted on the guide assembly. The gauge is configured to be rotated by the guide assembly and indicates a measurement when the benchmark member contacts a first surface of the wall, the gauge contacts a second surface of the wall, and a central line of the gauge is coaxial with the benchmark line of the benchmark member.