The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Sep. 12, 2013
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Michael Dominic Graziani, Niskayuna, NY (US);

Thomas Kwok-Fah Foo, Niskayuna, NY (US);

Luca Marinelli, Niskayuna, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/06 (2006.01); A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
A61B 5/062 (2013.01); A61B 5/0515 (2013.01);
Abstract

Magnetic material imaging (MMI) system including a first array of elongated wire segments that extend substantially parallel to an imaging plane. The imaging plane is configured to extend through a region-of-interest (ROI) of an object. The MMI system also includes a second array of elongated wire segments that extend substantially parallel to the imaging plane. The first and second arrays of wire segments are spaced apart with the imaging plane therebetween. The first and second arrays of wire segments form segment pairs. Each segment pair includes a wire segment of the first array and a wire segment of the second array, wherein the wire segments substantially coincide along a segment plane. The MMI system also includes a phase-control module configured to control a flow of current through the wire segments of the segment pairs to generate and move a one-dimensional field free region (1D FFR) within the imaging plane.


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