The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

May. 31, 2014
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Mark N. Gamadia, Cupertino, CA (US);

Iain A. McAllister, Campbell, CA (US);

Steven Webster, Palo Alto, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); H04N 5/228 (2006.01); H04N 5/225 (2006.01); G02B 27/62 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2251 (2013.01); G02B 27/62 (2013.01); H04N 5/2253 (2013.01);
Abstract

Some embodiments include methods for correcting optical alignment of components in a camera module for a multifunction device. In some embodiments, components of a camera module for use in a multifunction device are assembled on a test station. Some embodiments include a method that includes capturing a single test image, calculating from the spatial frequency response data an optical tilt between the optical axis of a lens and an optical axis of the image sensor of the camera module, and mechanically adjusting an alignment of the lens and the optical axis of the image sensor of the camera module to reduce the optical tilt. In some embodiments, the capturing is performed using the components of the camera module, and the single test image contains visually encoded spatial frequency response data for characterizing the components of the camera module.


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