The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 24, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Nobutaka Miyake, Yokohama, JP;
Junichi Nakagawa, Tokyo, JP;
Akitoshi Yamada, Yokohama, JP;
Tomokazu Ishikawa, Yokohama, JP;
Shinjiro Hori, Yokohama, JP;
Fumitaka Goto, Tokyo, JP;
Ryosuke Iguchi, Kawasaki, JP;
Hidetsugu Kagawa, Kawasakai, JP;
Kouta Murasawa, Yokohama, JP;
Hiromitsu Akiba, Yokohama, JP;
Senichi Saito, Funabashi, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is a quantization processing method using dither patterns that make it possible to obtain a dot array having excellent dispersibility even in the case of a single color or mixed color inks. For this purpose, first and second dither patterns are prepared in order to respectively quantize multivalued data for a first ink to different pieces of binary data, respectively. Also, third and fourth dither patterns are prepared in order to respectively quantize multivalued data for a second ink to different pieces of binary data. Further, on the basis of a combination of the multivalued data on the first ink and the multivalued data on the second ink, a quantization unit for the first ink, and a quantization unit for the second ink are determined.