The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Jun. 09, 2011
Applicants:

Nelson Hall, Kent, WA (US);

Keith Lanan, Renton, WA (US);

Oscar E. Morel, Seattle, WA (US);

Inventors:

Nelson Hall, Kent, WA (US);

Keith Lanan, Renton, WA (US);

Oscar E. Morel, Seattle, WA (US);

Assignee:

UTILX Corporation, Kent, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01); H04M 3/30 (2006.01); H04B 3/46 (2015.01); G01R 27/06 (2006.01);
U.S. Cl.
CPC ...
H04M 3/306 (2013.01); G01R 31/11 (2013.01); H04B 3/46 (2013.01); G01R 27/06 (2013.01);
Abstract

Methods of testing at least a transmission line of interest within a group of transmission lines for anomalies using Time Domain Reflectometry are provided. The testing methods set forth herein aim to improve, for example, the quality and accuracy of information collected when propagating signals along a length of transmission line in order to pinpoint specific anomalies. To achieve this and other benefits, the testing methods simultaneously impose, for example, pulses of equal magnitude and form onto a group of transmission lines, such as the phases cables of a three phase power transmission cable system. From this, at least one transmission line from the group is monitored for reflected signals caused by impedance change. An example TDR is also provided.


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