The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Oct. 12, 2011
Applicants:

Joseph J. Schwarzwalder, Bristow, VA (US);

James C. Rector, Warrenton, VA (US);

Robert L. Kettig, Herndon, VA (US);

Inventors:

Joseph J. Schwarzwalder, Bristow, VA (US);

James C. Rector, Warrenton, VA (US);

Robert L. Kettig, Herndon, VA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 9/00 (2006.01); H04L 27/00 (2006.01); H04B 1/7103 (2011.01);
U.S. Cl.
CPC ...
H04B 1/7103 (2013.01);
Abstract

A method for detecting a signal includes channelizing a digitized radio frequency (RF) environment to generate first tier channel outputs. The digitized RF environment includes a first bandwidth. Each first tier channel output has a second bandwidth smaller than the first bandwidth. Each first tier channel output overlaps at least a portion of at least one adjacent first tier channel output. One or more of the first tier channel outputs are channelized to generate multiple second tier channel outputs. Each second tier channel output has a third bandwidth that is smaller than the second bandwidth. Each second tier channel output overlaps at least a portion of at least one adjacent second tier channel output. The method includes performing a comparison of signal data from each second tier channel output to first signal feature data and determining whether a potential target signal is present in the digitized RF environment.


Find Patent Forward Citations

Loading…