The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Oct. 16, 2014
Applicant:

Marvell International Ltd., Hamilton HM 12, BM;

Inventors:

Davide Visani, Pavia, IT;

Luca Vercesi, Pavia, IT;

Fernando De Bernardinis, Pavia, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/12 (2006.01); G04F 10/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1255 (2013.01); G04F 10/005 (2013.01);
Abstract

An apparatus comprises a plurality of Analog to Digital Converter circuits (ADCs) and a skew detector configured to determine a plurality of indicators corresponding to a plurality of sampling time skews of the plurality of ADCs, respectively. The plurality of ADCs is configured to adjust the plurality of sampling time skews according to the plurality of indicators, respectively. The apparatus is configured to reach an equilibrium state wherein the plurality of indicators are substantially equal. In an embodiment, the apparatus comprises a Time-Interleaved ADC including the plurality of ADCs. A method comprises measuring a plurality of indicators of a plurality of sampling time skews, respectively. The plurality of sampling time skews are associated with a plurality of ADCs, respectively. The plurality of sampling time skews are adjusted according to respective indicators of the plurality of indicators.


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