The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Sep. 30, 2013
Applicant:

Broadcom Corporation, Irvine, CA (US);

Inventors:

Paul Penzes, Irvine, CA (US);

Mark Fullerton, Austin, TX (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 35/00 (2006.01); H03L 7/08 (2006.01); H03K 3/03 (2006.01); H03K 3/037 (2006.01); H03K 19/01 (2006.01); G06F 12/14 (2006.01); G06F 21/44 (2013.01); H03K 5/13 (2014.01); H03L 7/097 (2006.01); H03L 7/099 (2006.01); G06F 1/32 (2006.01); G06F 1/26 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03L 7/0802 (2013.01); G06F 1/32 (2013.01); G06F 12/14 (2013.01); G06F 21/44 (2013.01); H03K 3/0315 (2013.01); H03K 3/0375 (2013.01); H03K 5/133 (2013.01); H03K 19/01 (2013.01); H03L 7/097 (2013.01); H03L 7/0997 (2013.01); G06F 1/26 (2013.01); G06F 1/3203 (2013.01); G06F 1/3228 (2013.01); H01L 2924/0002 (2013.01); H03K 2005/00026 (2013.01); H03K 2005/00058 (2013.01);
Abstract

Certain semiconductor processes provide for the use of multiple different types of transistors with different threshold voltages in a single IC. It can be shown that in certain ones of these semiconductor processes, the speed at which high threshold transistors can operate at decreases with decreasing temperature. Thus, the overall processing speed of an IC that implements high threshold transistors is often limited by the lowest temperature at which the IC is designed (or guaranteed) to properly function. Embodiments of a system and method that overcome this deficiency by 'pre-heating' the IC (or at least portions of the IC that implement the high threshold transistors) such that the IC can operate at a frequency (once pre-heated) higher than what would otherwise be possible for a given, minimum temperature at which the IC is designed (or guaranteed) to properly function at are provided.


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