The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Feb. 04, 2015
Applicant:
Dsp Group Ltd.;
Inventors:
Assignee:
DSP GROUP LTD., Herzeliya, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 7/00 (2006.01); H03H 17/06 (2006.01); H04L 27/26 (2006.01); G10L 19/00 (2013.01); G10L 21/04 (2013.01); H04L 7/033 (2006.01); G10L 19/008 (2013.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
H03H 17/0657 (2013.01); G10L 19/00 (2013.01); G10L 19/008 (2013.01); G10L 21/04 (2013.01); H03H 17/0664 (2013.01); H03H 17/0685 (2013.01); H04L 7/0037 (2013.01); H04L 7/033 (2013.01); H04L 27/2657 (2013.01);
Abstract
A device, comprising a first interpolator that is configured to (a) receive, at a first clock rate, a first signal having a first sampling rate and (b) output, at a second clock rate, a second signal having a first desired sampling rate average; wherein the first interpolator comprises: a first buffer for storing the first signal; and a first fractional sampling ratio circuit that is configured to generate a first pattern of fixed point values, wherein an average value of the first pattern corresponds to a first desired sampling rate ratio between the first desired sampling rate average and the first sampling rate.