The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Jan. 15, 2014
Applicant:

Sharp Laboratories of America, Inc., Camas, WA (US);

Inventor:

Bryan Severt Hallberg, Vancouver, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01); G10K 11/16 (2006.01);
U.S. Cl.
CPC ...
G10K 11/16 (2013.01);
Abstract

A noise event suppression technique for a monitoring system detects a noise event in a signal waveform when a focal sample in the waveform has an amplitude greater than an amplitude of algorithmically determined earlier and later samples in the waveform that are noncontiguous with the focal sample. When the monitoring system detects the noise event, the monitoring system reduces the amplitude of the focal sample to an amplitude between those of the earlier and later samples. The monitoring system outputs data determined using the waveform once noise events have been adequately suppressed.


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