The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Apr. 18, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Claus Huempel, Tuebingen, DE;

Pamela A. Nesbitt, Ridgefield, CT (US);

Jake Palmer, Durham, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01);
Abstract

One embodiment of the invention comprises a method for constructing a graph pertaining to a specified metric. Measured values of the specified metric are selectively stored, wherein each stored value comprises a data point. The method further includes routing successive data points to a location associated with the graph, wherein a first number of data points are included in a specified graph time period. The method further includes using a value that represents a particular data level of detail to divide the specified graph time period into multiple time intervals, wherein each time interval includes a second number of data points. The method further includes selectively processing the second number of data points of a time interval, in accordance with prespecified criteria, to determine a most representative value for that time interval. The most representative values of respective time intervals are then used to construct the graph.


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