The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 25, 2013
Siemens Aktiengesellschaft, Munich, DE;
Rainer Raupach, Heroldsbach, DE;
Karl Stierstorfer, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for reconstructing image data of an examination object from measurement data, wherein the measurement data were captured previously during a relative rotational movement between a radiation source of a computed tomography system and the examination object. Filtered measurement data are calculated from the measurement data. First image data are calculated from the measurement data. Edge information is obtained from the first image data, wherein the edge information, depending on position, specifies strength and direction of edges within the first image data. New measurement data are calculated using the edge information by mixing the measurement data and the filtered measurement data and second image data are calculated from the new measurement data.