The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 14, 2012
Jong Sung Kim, Daejeon, KR;
Seong Min Baek, Daejeon, KR;
Myung Gyu Kim, Daejeon, KR;
IL Kwon Jeong, Daejeon, KR;
Jong Sung Kim, Daejeon, KR;
Seong Min Baek, Daejeon, KR;
Myung Gyu Kim, Daejeon, KR;
Il Kwon Jeong, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Disclosed are a method and apparatus for measuring rotation characteristics such as rotation rate, rotation axis, and rotation angle of a rotating body. A method of measuring rotation characteristics includes extracting a rotating-body region from an image of the rotating body; extracting a surface pattern of the rotating body on the basis of brightness values of the extracted rotating-body region and acquiring rotation characteristics of the rotating body on the basis of change in the extracted surface pattern. Accordingly, it is possible to accurately measure rotation characteristics regardless of variation in brightness values of a surface region of the rotating body depending on illumination of a lamp, sensitivity of a camera, and exposure time of a camera.