The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 20, 2013
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Xiaofeng Liu, Niskayuna, NY (US);
Albert Montillo, Niskayuna, NY (US);
Ek Tsoon Tan, Mechanicville, NY (US);
John F. Schenck, Voorheesville, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0089 (2013.01); G06T 7/0081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20128 (2013.01); G06T 2207/30016 (2013.01);
Abstract
Systems and methods for image segmentation using a deformable atlas are provided. One method includes obtaining one or more target images, obtaining one or more propagated label probabilities for the one or more target images, and segmenting the one or more target images using a cost function of a deformable atlas model. The method further includes identifying segmented structures within the one or more target images based on the segmented one or more target images.