The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Mar. 28, 2012
Applicants:

Gazi Ali, Mountain View, CA (US);

Pingshan LI, Sunnyvale, CA (US);

Akira Matsui, Tokyo, JP;

Takami Mizukura, Tokyo, JP;

Inventors:

Gazi Ali, Mountain View, CA (US);

Pingshan Li, Sunnyvale, CA (US);

Akira Matsui, Tokyo, JP;

Takami Mizukura, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0069 (2013.01); H04N 5/23212 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10148 (2013.01);
Abstract

A system and method for supporting a depth estimation procedure by utilizing an adaptive kernel includes a capture subsystem for capturing images of a photographic target. The capture subsystem includes an aperture that is adjustable for admitting reflected light from the photographic target to a sensor device. An adaptive kernel is designed in a kernel design procedure based upon symmetry characteristics of the aperture. The adaptive kernel may be designed in either a frequency-domain kernel design procedure or in a spatial-domain kernel design procedure. A depth estimator utilizes the adaptive kernel for performing the depth estimation procedure.


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