The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 20, 2013
Texas Instruments Incorporated, Dallas, TX (US);
Hrushikesh Tukaram Garud, Maharashtra, IN;
Debdoot Sheet, West Bengal, IN;
Ajoy Kumar Ray, West Bengal, IN;
Manjunatha Mahadevappa, West Bengal, IN;
Jyotirmoy Chatterjee, West Bengal, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A novel modification to the order statistics filters called the Adaptive Weighted-Local-Difference Order Statistics is shown that will act as a generic framework for the design of adaptive filters suitable for specific signal processing applications. To demonstrate the design of filters using this framework two implementations were defined and evaluated: Edge Orientation Adaptive Weighted-Local-Difference Median Filter (EOAWLDMF) and Luminance-Similarity Adaptive Weighted-Local-Difference Median Filter (LSAWLDMF) for restoration of noisy images.