The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Sep. 17, 2013
Flir Systems, Inc., Wilsonville, OR (US);
Nicholas Högasten, Santa Barbara, CA (US);
Malin Ingerhed, Linköping, SE;
Mark Nussmeier, Goleta, CA (US);
Eric A. Kurth, Santa Barbara, CA (US);
Theodore R. Hoelter, Goleta, CA (US);
Katrin Strandemar, Rimbo, SE;
Pierre Boulanger, Goleta, CA (US);
Barbara Sharp, Santa Barbara, CA (US);
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Methods and systems are provided to reduce noise in thermal images. In one example, a method includes receiving an image frame comprising a plurality of pixels arranged in a plurality of rows and columns. The pixels comprise thermal image data associated with a scene and noise introduced by an infrared imaging device. The image frame may be processed to determine a plurality of column correction terms, each associated with a corresponding one of the columns and determined based on relative relationships between the pixels of the corresponding column and the pixels of a neighborhood of columns. In another example, the image frame may be processed to determine a plurality of non-uniformity correction terms, each associated with a corresponding one of the pixels and determined based on relative relationships between the corresponding one of the pixels and associated neighborhood pixels within a selected distance.