The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Aug. 06, 2010
Applicants:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, Cupertino, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Inventors:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, Cupertino, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6292 (2013.01); G06K 9/6254 (2013.01);
Abstract

Systems and methods for implementing a hierarchical image recognition framework for classifying digital images are provided. The provided hierarchical image recognition framework utilizes a multi-layer approach to model training and image classification tasks. A first layer of the hierarchical image recognition framework generates first layer confidence scores, which are utilized by the second layer to produce a final recognition score. The provided hierarchical image recognition framework permits model training and image classification tasks to be performed more accurately and in a less resource intensive fashion than conventional single-layer image recognition frameworks. In some embodiments real-time operator guidance is provided for an image classification task.


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