The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Jan. 13, 2014
Applicant:

Zimperium, Inc., San Francisco, CA (US);

Inventors:

Yaniv Karta, Tel Aviv, IL;

Itzhak Avraham, Tel Aviv, IL;

Esteban Pellegrino, Buenos Aires, AR;

Assignee:

Zimperium, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01);
Abstract

A security system receives attribute samples from one or more devices configured to simulate one or more states (such as attack states). The attribute samples are aggregated, normalized to a common format, and quantized to lower the resolution of the attribute samples. Outlier attribute samples and attribute samples determined to not be correlated to the simulated states are removed to form a pruned set of attribute samples. A set of classifiers is generated based on a first portion of the pruned set of attribute samples, and the set of classifiers is tested based on a second portion of the pruned set of attribute samples. A subset of the classifiers can be provided to a device configured to monitor attributes associated with the subset of classifiers and to identify an attack state based on the monitor attributes.


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