The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
May. 06, 2014
Xilong Chen, Chapel Hill, NC (US);
Mark Roland Little, Cary, NC (US);
Xilong Chen, Chapel Hill, NC (US);
Mark Roland Little, Cary, NC (US);
SAS INSTITUTE, INC., Cary, NC (US);
Abstract
Techniques to simulate statistical tests are described. An apparatus may comprise a simulated data component to generate simulated data for a statistical test, where statistics of the statistical test are based on parameter vectors to follow a probability distribution, a statistic simulator component to generate statistics for the parameter vectors from the simulated data, each parameter vector represented with a single point in a grid of points, the statistic simulation component to distribute portions of the simulated data or simulated statistics across multiple nodes of a distributed computing system in accordance with a column-wise or column-wise-by-group distribution algorithm, and a code generator component to create a computational representation arranged to generate an approximate probability distribution for each point in the grid of points from the simulated statistics, the approximate probability distribution to comprise an empirical cumulative distribution function (CDF). Other embodiments are described and claimed.