The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Jun. 29, 2012
Chih-kuang Chang, New Taipei, TW;
Xin-yuan Wu, Shenzhen, CN;
Wei-quan Wu, Shenzhen, CN;
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method processes measurement data of an object using a computing device. The method obtains measurement data of preselected feature elements of a measured object, inserts the measurement data of the preselected feature elements into a data list, obtains measured results of the preselected feature elements from a measurement tool, and calculates tolerance values of the preselected feature elements according to the measured results. The method further searches pixel icons of the preselected feature elements according to tolerance values and the measured results, inserts the pixel icons and the measured results into the data list, receives selections of a user and displays the data list in different list modes.