The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Dec. 20, 2011
Applicants:

Manuel Antonio D'abreu, El Dorado Hills, CA (US);

Stephen Skala, Fremont, CA (US);

Inventors:

Manuel Antonio D'Abreu, El Dorado Hills, CA (US);

Stephen Skala, Fremont, CA (US);

Assignee:

SANDISK TECHNOLOGIES INC., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G06F 2212/1036 (2013.01); G06F 2212/7208 (2013.01); G06F 2212/7211 (2013.01);
Abstract

A method of managing wear leveling in a data storage device includes determining whether a reliability measurement associated with a first portion of a first nonvolatile memory die satisfies a threshold. The first nonvolatile memory die is included in a plurality of memory dies. The method includes, in response to determining that the reliability measurement associated with the first portion of the first nonvolatile memory die satisfies the threshold, transferring first data from the first portion of the first nonvolatile memory die to a second nonvolatile memory die of the plurality of memory dies.


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