The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Oct. 05, 2010
Applicants:
Frank Dubois, Brussels, BE;
Catherine Yourassowsky, Brussels, BE;
Inventors:
Frank Dubois, Brussels, BE;
Catherine Yourassowsky, Brussels, BE;
Assignee:
UNIVERSITE LIBRE DE BRUXELLES, Brussels, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/32 (2006.01); G02B 21/00 (2006.01); G02B 5/18 (2006.01); G01B 9/021 (2006.01); G03H 1/08 (2006.01); G03H 1/02 (2006.01); G03H 1/04 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G03H 1/08 (2013.01); G02B 21/00 (2013.01); G03H 1/02 (2013.01); G03H 1/0443 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0212 (2013.01); G03H 2001/0456 (2013.01); G03H 2222/13 (2013.01); G03H 2222/18 (2013.01); G03H 2222/23 (2013.01); G03H 2222/24 (2013.01);
Abstract
An Interferometer for off-axis digital holographic microscopy includes a recording plane, and a grating located in a plane optically conjugated with the recording plane. The grating defining a first and a second optical path, the optical path corresponding to different diffraction order.