The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Nov. 26, 2013
Applicant:

Johnson & Johnson Vision Care, Inc., Jacksonville, FL (US);

Inventors:

Christopher Wildsmith, Jacksonville, FL (US);

Xin Wei, I, Jacksonville, FL (US);

Assignee:

Johnson & Johnson Vision Care, Inc., Jacksonville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); G02C 7/04 (2006.01); A61B 3/10 (2006.01); G06F 17/10 (2006.01); G02C 7/02 (2006.01);
U.S. Cl.
CPC ...
G02C 7/04 (2013.01); A61B 3/1015 (2013.01); G02C 7/028 (2013.01); G02C 7/048 (2013.01); G06F 17/10 (2013.01); G02C 2200/04 (2013.01); G02C 2200/22 (2013.01);
Abstract

An apparatus and method for selecting a lens that accounts for Decentration and/or Rotation Errors. The method includes obtaining results of a first wavefront exam on a patient, including a wavefront map and Zernike polynomials, selecting a first lens that improves vision, obtaining the results of a second wavefront exam including a wavefront map and Zernike polynomials, calculating the Decentration and/or Rotation Errors of the selected lens by calculating a difference between the Zernike polynomails, and selecting a second lens that better corrects accounts for the calculated Decentration and/or Rotation Errors.


Find Patent Forward Citations

Loading…