The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Mar. 30, 2011
Applicants:

Masamiki Kawase, Tokyo, JP;

Hidekazu Suto, Tokyo, JP;

Inventors:

Masamiki Kawase, Tokyo, JP;

Hidekazu Suto, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/262 (2006.01); H04N 5/225 (2006.01); G02B 7/02 (2006.01); G03B 17/14 (2006.01); H04N 5/357 (2011.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
G02B 7/023 (2013.01); G02B 13/0015 (2013.01); G03B 17/14 (2013.01); H04N 5/2254 (2013.01); H04N 5/3572 (2013.01); G03B 2217/18 (2013.01);
Abstract

An imaging apparatus includes: a lens mount section; an imager having an imaging plane on which an image having an image height obtained through a lens device mounted to the lens mount section is formed; an imaging process section correcting transverse chromatic aberration of an imaging signal obtained by the imager; and a control section determining an imager size in accordance with the diameter of the lens device mounted to the lens mount section and correcting a correction coefficient for the correction of transverse chromatic aberration at the imaging process section according to the size thus determined.


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