The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Jul. 29, 2013
Applicant:

Chevron U.s.a., Inc., San Ramon, CA (US);

Inventors:

Jinsong Chen, San Ramon, CA (US);

Gary Michael Hoversten, Lafayette, CA (US);

Assignee:

CHEVRON U.S.A. INC., San Ramon, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G 7/48 (2006.01); G01V 99/00 (2009.01); G06N 7/00 (2006.01); G01V 1/30 (2006.01); G01V 3/38 (2006.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G01V 1/306 (2013.01); G01V 3/38 (2013.01); G01V 11/00 (2013.01); G06N 7/005 (2013.01); G01V 2210/614 (2013.01); G01V 2210/6163 (2013.01); G01V 2210/6169 (2013.01); G01V 2210/622 (2013.01); G01V 2210/624 (2013.01); G01V 2210/6242 (2013.01); G01V 2210/6244 (2013.01);
Abstract

A system and a method for estimating a reservoir parameter are provided. The method includes calculating a plurality of priors using a Markov random field, the plurality of priors comprising probability distributions of a plurality of litho-types; calculating posterior distributions based on the priors, the posterior distribution depending upon measured geophysical data, geophysical attributes and reservoir parameters; and determining at least a portion of litho-types in the plurality of litho-types that correlate most with the measured geophysical data.


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