The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9207289 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 08, 2015

Filed:

Oct. 16, 2012
Applicant:

Fujitsu Limited, Kawasaki-shi, JP;

Inventor:

Koichi Shimizu, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0064 (2013.01);
Abstract

A magnetic property analyzing apparatus calculates vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements, and performs a magnetic field analysis of sub-grids arranged along one direction within each of the elements. An average magnetization with respect to each of the elements is calculated by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis.


Find Patent Forward Citations

Shimizu, Koichi. (2015). Magnetic property analyzing method and apparatus (U.S. Patent No. 9207289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9207289

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